IEEE

CDM secondary clamp of RX and TX for high speed SerDes application in 40nm CMOS technology

Abstract: Novel secondary clamp solutions to boost CDM robustness for both RX and TX circuits along with dual diode of 135fF to meet over 6-G bit/s SerDes are presented. For RX circuit, active PMOS ...
IEEE

Predictive simulation of CDM events to study effects of package, substrate resistivity and ...

Abstract: Power domain crossing circuits, also known as internal I/O's, are susceptible to gate oxide damage during charged device model (CDM) events. Circuit-level simulations of internal I/O ...
Business Wire

Apache Introduces PathFinder, the Industry’s First Full-chip ESD Physical Integrity Solution

SAN JOSE, Calif.--(BUSINESS WIRE)--Apache Design Solutions, the technology leader in power integrity and noise closure for chip-package-systems (CPS) convergence, today announced PathFinder™, a ...